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Technical Briefs

Joule Heat Welding of Thin Platinum and Tungsten Wires and the Thermoelectric Effects Around Bi-Metal Junctions

[+] Author and Article Information
Hironori Tohmyoh

e-mail: tohmyoh@ism.mech.tohoku.ac.jp

Masumi Saka

Department of Nanomechanics,
Tohoku University,
Aoba 6-6-01, Aramaki, Aoba-ku,
Sendai 980-8579, Japan

1Corresponding author.

Contributed by the Manufacturing Engineering Division of ASME for publication in the JOURNAL OF MICRO- AND NANO-MANUFACTURING. Manuscript received January 19, 2012; final manuscript received February 20, 2013; published online April 17, 2013. Assoc. Editor: J. Rhett Mayor. Paper presented at the 2011 International Electronic Packaging Technical Conference and Exhibition (IPACK2011), Portland, Oregon, July 6–8, 2011.

J. Micro Nano-Manuf 1(2), 024501 (Apr 17, 2013) (4 pages) Paper No: JMNM-12-1009; doi: 10.1115/1.4024082 History: Received January 19, 2012; Revised February 20, 2013

Fine thermoelectric elements were fabricated on electrode chips by welding together the tips of thin 5 μm diameter Pt and W wires by Joule heat welding. The Pt/W junction was heated by bringing it into contact with a wire carrying a current, thus generating a voltage due to the Seebeck effect in the circuit containing the junction. The Pt/W junctions of two thermoelectric elements in separate circuits were brought into contact with each other. Current was supplied to one of the thermoelectric elements, while the temperature was measured using the other element as a thermocouple. The temperature, which is due to the Peltier effect, was found to depend on the direction of current supply.

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References

Williams, C. C., and Wickramasinghe, H. K., 1986, “Scanning Thermal Profiler,” Appl. Phys. Lett., 49, pp. 1587–1589. [CrossRef]
Shi, L., Plyasunov, S., Bachtold, A., McEuen, P. L., and Majumdar, A., 2000, “Scanning Thermal Microscopy of Carbon Nanotubes Using Batch-Fabricated Probes,” Appl. Phys. Lett., 77, pp. 4295–4297. [CrossRef]
Shen, B., Xiao, G., Guo, C., Malkin, S., and Shih, A. J., 2008, “Thermocouple Fixation Method for Grinding Temperature Measurement,” ASME J. Manuf. Sci. Eng., 130, p. 051014. [CrossRef]
Tohmyoh, H., Takeda, H., Khan, M. N. I., and Saka, M., 2010, “Fabrication of Freestanding Thin Pt/W Thermocouple by Joule Heat Welding,” 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), pp. 1–4.
Yadav, A., Pipe, K. P., and Shtein, M., 2008, “Fiber-Based Flexible Thermoelectric Power Generator,” J. Power Sources, 175, pp. 909–913. [CrossRef]
Hewitt, C. A., Kaiser, A. B., Roth, S., Craps, M., Czerw, R., and Carroll, D. L., 2012, “Multilayered Carbon Nanotube/Polymer Composite Based Thermoelectric Fabrics,” Nano Lett., 12, pp. 1307–1310. [CrossRef] [PubMed]
Boukai, A. I., Bunimovich, Y., Tahir-Kheli, J., Yu, J.-K., Goddard, W. A.III, and Heath, J. R., 2008, “Silicon Nanowires as Efficient Thermoelectric Materials,” Nature, 451, pp. 168–171. [CrossRef] [PubMed]
Hirayama, H., Kawamoto, Y., Ohsima, Y., and Takayanagi, K., 2001, “Nanospot Welding of Carbon Nanotubes,” Appl. Phys. Lett., 79, pp. 1169–1171. [CrossRef]
Tohmyoh, H., Imaizumi, T., Hayashi, H., and Saka, M., 2007, “Welding of Pt Nanowires by Joule Heating,” Scr. Mater., 57, pp. 953–956. [CrossRef]
Jin, C., Suenaga, K., and Iijima, S., 2008, “Plumbing Carbon Nanotubes,” Nature Nanotechnol., 3, pp. 17–21. [CrossRef]
Peng, Y., Cullis, T., and Inkson, B., 2009, “Bottom-Up Nanoconstruction by the Welding of Individual Metallic Nanoobjects Using Nanoscale Solder,” Nano Lett., 9, pp. 91–96. [CrossRef] [PubMed]
Tohmyoh, H., and Fukui, S., 2009, “Self-Completed Joule Heat Welding of Ultrathin Pt Wires,” Phys. Rev. B, 80, p. 155403. [CrossRef]
Tohmyoh, H., 2009, “A Governing Parameter for the Melting Phenomenon at Nanocontacts by Joule Heating and Its Application to Joining Together Two Thin Metallic Wires,” J. Appl. Phys., 105, p. 014907. [CrossRef]
Sacharoff, A. C., and Westervelt, R. M., 1984, “Physical Properties of Ultrathin Drawn Pt Wires,” Phys. Rev. B, 29, pp. 6411–6418. [CrossRef]
Tohmyoh, H., Takeda, H., and Saka, M., 2009, “Fabrication of a Free-Standing Pt Micro-Ring on an Electrode Chip as a Small Magnetic Source,” J. Micromech. Microeng. 19, p. 085013. [CrossRef]
Cusak, N., and Kendall, P., 1958, “The Absolute Scale of Thermoelectric Power at High Temperature,” Proc. Phys. Soc., 72, pp. 898–901. [CrossRef]

Figures

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Fig. 1

An example of Joule heat welding for thin Pt and W wires. (a) Before current supply. (b) After current supply. The inset shows the details of region A in (b).

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Fig. 2

(a) Setup for fabricating the thermoelectric elements. (b) SEM micrograph of thin W wire (5 μm). (c) Thin Pt wire (5 μm) covered with Ag (75 μm) and thick W wire (20 μm) on an electrode chip. Here the thin Pt wire and thick W wire are electrically isolated by a gap between the electrodes. (d) Magnified view of B in (c) showing the thin Pt wire (5 μm).

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Fig. 3

(a) An example of a fabricated thermoelectric element (TE-A). (b) Magnified view of C in (a) showing the detail around the Pt/W junction.

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Fig. 4

Experimental circuits for observing (a) Seebeck effect and (b) Peltier effect

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Fig. 5

Confirmation of the Seebeck effect. (a) Relationships between V12 and IH. (b) Relationships between V12 versus ΔT.

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Fig. 6

Confirmation of the Peltier effect (a) ΔT versus IT (b) ΔTCCW − ΔTCW versus IT

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