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Technical Brief

A Molecular Dynamics Study of PDMS Stamp Based Graphene Exfoliation

[+] Author and Article Information
Buddhika Jayasena

The George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia, 30332
buddhikaphd@gmail.com

Shreyes Melkote

The George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia, 30332
shreyes.melkote@me.gatech.edu

1Corresponding author.

ASME doi:10.1115/1.4038606 History: Received May 21, 2017; Revised November 21, 2017

Abstract

Molecular Dynamics (MD) simulations are used to gain insights into the process conditions that cause separation of graphene layers from a highly ordered pyrolytic graphite (HOPG) source in a polydimethylsiloxane (PDMS) stamp assisted mechanical exfoliation process. Specifically, the effects of selected exfoliation process parameters and pre-existing defects, such as layer discontinuities in the graphite source, on the exfoliation process are investigated. The results show that exfoliation of individual and few layer graphene requires delicate control of the normal force applied to the HOPG by the PDMS stamp. The study also shows that defects (e.g. discontinuities) in the HOPG have a significant impact on the thickness of separated layers and the layer separation force. The insights derived from this study are expected to be very useful in the development of a low-cost, scalable, large area graphene production process.

Copyright (c) 2017 by ASME
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