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  • Proceedings Article January 01, 2009

    Achim Pahlke; Simon Rosen; Markus Kästner; Hans-Christian Möhring; Eduard Reithmeier; Berend Denkena

    Proc. ASME. 49002; Volume 3: ASME/IEEE 2009 International Conference on Mechatronic and Embedded Systems and Applications; 20th Reliability, Stress Analysis, and Failure Prevention Conference:247-254.January 01, 2009
    DETC2009-86658
    doi: 10.1115/DETC2009-86658