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Keywords: substrates
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Appl. Mech. July 2010, 77(4): 041016.
Published Online: April 16, 2010
...YongAn Huang; ZhouPing Yin; YouLun Xiong Thermomechanical analysis of global and local buckling is presented to show temperature effects on the stress/strain and shape of a film-on-substrate system. First, the strain is expressed as a function of three key temperatures (room, working, and deposit...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Appl. Mech. March 2008, 75(2): 021022.
Published Online: February 27, 2008
...X. Feng; Y. Huang; A. J. Rosakis Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to uniform film stress and system curvature states over the entire system of a single thin film on a substrate. By considering a circular...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Appl. Mech. January 2008, 75(1): 011008.
Published Online: January 11, 2008
...Yin Zhang The curvature-stress relation is studied for a film-substrate bilayer with the effect of interfacial slip and compared with that of an ideal interface without interfacial slip. The interfacial slip together with the dimensions, elastic and interfacial properties of the film and substrate...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. November 2007, 74(6): 1276–1281.
Published Online: January 14, 2007
...X. Feng; Y. Huang; A. J. Rosakis Current methodologies used for the inference of thin film stress through system curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis, and co...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. November 2007, 74(6): 1225–1233.
Published Online: February 9, 2006
...Y. Huang; A. J. Rosakis Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states that are assumed to remain uniform over the entire film/substrate system. By considering a circular thin film/substrate...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2004, 71(5): 691–696.
Published Online: November 9, 2004
...R. Krishnamurthy; D. J. Srolovitz We present closed-form solutions for stresses in a thin film resulting from a purely dilatational stress-free strain that can vary arbitrarily within the film. The solutions are specific to a two-dimensional thin film on a thick substrate geometry and are presented...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. July 2002, 69(4): 425–432.
Published Online: June 20, 2002
...S. P. A. Gill; H. Gao, Mem. ASME; V. Ramaswamy; W. D. Nix Changes in substrate curvature indicating the existence of compressive stress in isolated crystallites are commonly observed during the initial stages of thin film deposition of metals on glass or ceramic substrates. Following the suggestion...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. July 2002, 69(4): 419–424.
Published Online: June 20, 2002
...Y. F. Gao; Z. Suo This paper models the domain dynamics in a ferroelastic epilayer within the time-dependent Ginzburg-Landau (TDGL) framework. Constrained on a paraelastic substrate of square symmetry, the epilayer has rectangular symmetry, and forms domains of two variants. The domain wall energy...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. July 2002, 69(4): 407–414.
Published Online: June 20, 2002
...S. P. Baker, Mem. ASME; X. Wang; C.-Y. Hui Nonlinear unloading behavior has been observed in thin metal films on substrates. In the present work, the effects of this nonlinear unloading behavior on the strain energy release rate in bilayer decohesion experiments, in which a highly stressed...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. March 2002, 69(2): 97–103.
Published Online: October 5, 2001
...C. Q. Ru This paper studies surface instability of a compliant elastic thin film on a rigid substrate interacting with a suspended elastic plate through van der Waals forces. The analysis is based on a novel method which permits a simple rational expression for the interaction coefficient...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. March 2001, 68(2): 298–303.
Published Online: October 19, 2000
...A. Wikstro¨m; P. Gudmundson, Mem. ASME Thermal curvature changes and membrane strains are analyzed for elastic shallow shell substrates which are coated by thin, generally inelastic, inhomogeneous and anisotropic layers. The analysis is restricted to linear kinematics. It is shown...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Appl. Mech. September 2000, 67(3): 590–596.
Published Online: November 7, 1999
...R. Sburlati; E. Madenci, Mem. ASME; I. Guven An analytical study investigating the local buckling response of a circular delamination along the interface of an elastic layer and a dissimilar substrate with finite thickness is presented. The solution method utilizes the stability equations of linear...