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Keywords: atomic force microscopy
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Journal Articles
Journal Articles
Publisher: ASME
Article Type: Guest Editorial
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 060301.
Published Online: November 10, 2009
...Nader Jalili; Laxman Saggere; Arvind Raman 10 11 2009 10 11 2009 atomic force microscopy manipulators nanoelectromechanical devices scanning probe microscopy Most of today's emerging nanotechnological applications such as nanoelectromechanical systems require...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061107.
Published Online: November 6, 2009
...Amin Salehi-Khojin; Saeid Bashash; Nader Jalili; Gary Lee Thompson; Alexey Vertegel Piezoresponse force microscopy (PFM) is an atomic force microscopy-based approach utilized for measuring local properties of piezoelectric materials. The objective of this study is to propose a practical framework...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061104.
Published Online: November 6, 2009
...Georg E. Fantner; Daniel J. Burns; Angela M. Belcher; Ivo W. Rangelow; Kamal Youcef-Toumi New developments in MEMS (microelectromechanical systems) fabrication allowed the development of new types of atomic force microscopy (AFM) sensor with integrated readout circuit and actuator built...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061105.
Published Online: November 6, 2009
... Flow Mixing Conditions ,” Cryst. Growth Des. 1528-7483 , 4 , pp. 1045 – 1052 . 10.1021/cg049913l Croft , D. , Shedd , G. , and Devasia , S. , 2001 , “ Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application ,” ASME J. Dyn. Syst...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061106.
Published Online: November 6, 2009
.... Phys. Lett. 0003-6951 , 88 (3), p. 033104 . 10.1063/1.2164394 Rubio-Sierra , F. J. , Heckl , W. M. , and Stark , R. W. , 2005 , “ Nanomanipulation by Atomic Force Microscopy ,” Adv. Eng. Mater. 1438-1656 , 7 ( 4 ), pp. 193 – 196 . 10.1002/adem.200400174 Fearing...
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 064501.
Published Online: October 30, 2009
... nonuniform, so the models upon which dynamic calibration is based may not be appropriate for this probe. 15 05 2008 07 05 2009 30 10 2009 atomic force microscopy beams (structures) calibration cantilevers displacement measurement elastic constants error analysis Q-factor...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061103.
Published Online: October 30, 2009
...) standard RC, and (3) the modified RC with phase lead compensation. The results show that the latter reduces the steady-state tracking error to less than 2% at 25 Hz scan rate, an over 80% improvement compared with PID control. 30 05 2008 22 05 2009 30 10 2009 atomic force microscopy...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. September 2008, 130(5): 051005.
Published Online: August 1, 2008
...-speed adhesion-force measurements at nanoscale using AFM. Simulation and experimental results are presented and discussed to demonstrate the efficacy of the proposed method to compensate for the above two practical issues. adhesion atomic force microscopy design engineering errors flexible...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Dyn. Sys., Meas., Control. September 2004, 126(3): 531–546.
Published Online: December 3, 2004
... received by the ASME Dynamic Systems and Control Division December 9, 2003. Associate Editor: E. Misawa. 09 December 2003 03 12 2004 reduced order systems atomic force microscopy molecular biophysics proteins numerical analysis nonlinear dynamical systems linear systems...
Journal Articles
Publisher: ASME
Article Type: Technical Briefs
J. Dyn. Sys., Meas., Control. December 2005, 127(4): 705–709.
Published Online: October 17, 2004
... atomic force microscopy piezoelectric actuators beams (structures) dynamic response The atomic force ( 1 ) between the tip and sample of the atomic force microscope (AFM) is employed during the process of measurement. Some important observations of the AFM were made from the governing...
Journal Articles
Journal Articles
Journal Articles