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Keywords: scanning probe microscopy
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Journal Articles
Publisher: ASME
Article Type: Guest Editorial
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 060301.
Published Online: November 10, 2009
...Nader Jalili; Laxman Saggere; Arvind Raman 10 11 2009 10 11 2009 atomic force microscopy manipulators nanoelectromechanical devices scanning probe microscopy Most of today's emerging nanotechnological applications such as nanoelectromechanical systems require...
Journal Articles
Publisher: ASME
Article Type: Dynamic Modeling Control And Manipulation At The Nanoscale
J. Dyn. Sys., Meas., Control. November 2009, 131(6): 061101.
Published Online: October 28, 2009
... ,” Helv. Phys. Acta 0018-0238 , 55 , pp. 726 – 735 . Binnig , G. , Quate , C. F. , and Gerber , C. , 1986 , “ Atomic Force Microscope ,” Phys. Rev. Lett. 0031-9007 , 56 ( 9 ), pp. 930 – 933 . 10.1103/PhysRevLett.56.930 1994 , Scanning Probe Microscopy and Spectroscopy...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Dyn. Sys., Meas., Control. May 2008, 130(3): 031008.
Published Online: April 25, 2008
.... The controller is experimentally implemented on a three-dimensional nanopositioning stage for surface topography tracking, a problem typically encountered in scanning probe microscopy applications. 17 05 2006 23 01 2008 25 04 2008 A feedforward controller operates based on inverse plant...
Journal Articles