This paper explicitly establishes a modified creep model of a Sn–3.8Ag–0.7Cu alloy using a physical-based micromechanical modeling technique. Through experimentation and reformulation, steady-state creep behavior is analyzed with minimum strain rates for different temperatures 35 °C, 80 °C, and 125 °C. The new modified physical creep model is proposed, by understanding the respective precipitate strengthened deformation mechanism, seeing the dependency of the activation energy over the temperature along with stress and, finally, by integrating the subgrain-size dependency λss. The new model is found to accurately model the creep behavior of lead-free solder alloy by combining the physical state variables. The features of the creep model can be explored further by changing the physical variable such as subgrain size to establish a structure–property relationship for a better solder joint reliability performance.
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September 2017
Research-Article
Modified Constitutive Creep Laws With Micromechanical Modeling of Pb-Free Solder Alloys
Joel Thambi,
Joel Thambi
Innovation Center for Advanced Electronics,
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mails: luthersjoel@gmail.com;
joel.thambi@sabic.com
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mails: luthersjoel@gmail.com;
joel.thambi@sabic.com
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Andreas Schiessl,
Andreas Schiessl
Innovation Center for Advanced Electronics,
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mail: andreas.schiessl@continental-corporation.com
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mail: andreas.schiessl@continental-corporation.com
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Manuela Waltz,
Manuela Waltz
Faculty of Mechanical Engineering,
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Manuela.Waltz@thi.de
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Manuela.Waltz@thi.de
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Klaus-Dieter Lang,
Klaus-Dieter Lang
Faculty of Electrical Engineering and
Computer Science,
Technische Universität Berlin,
Berlin 10623, Germany
e-mail: klaus-dieter.lang@izm.fraunhofer.de
Computer Science,
Technische Universität Berlin,
Berlin 10623, Germany
e-mail: klaus-dieter.lang@izm.fraunhofer.de
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Ulrich Tetzlaff
Ulrich Tetzlaff
Faculty of Mechanical Engineering,
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Ulrich.Tetzlaff@thi.de
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Ulrich.Tetzlaff@thi.de
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Joel Thambi
Innovation Center for Advanced Electronics,
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mails: luthersjoel@gmail.com;
joel.thambi@sabic.com
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mails: luthersjoel@gmail.com;
joel.thambi@sabic.com
Andreas Schiessl
Innovation Center for Advanced Electronics,
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mail: andreas.schiessl@continental-corporation.com
Continental Automotive GmbH,
Regensburg 93055, Germany
e-mail: andreas.schiessl@continental-corporation.com
Manuela Waltz
Faculty of Mechanical Engineering,
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Manuela.Waltz@thi.de
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Manuela.Waltz@thi.de
Klaus-Dieter Lang
Faculty of Electrical Engineering and
Computer Science,
Technische Universität Berlin,
Berlin 10623, Germany
e-mail: klaus-dieter.lang@izm.fraunhofer.de
Computer Science,
Technische Universität Berlin,
Berlin 10623, Germany
e-mail: klaus-dieter.lang@izm.fraunhofer.de
Ulrich Tetzlaff
Faculty of Mechanical Engineering,
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Ulrich.Tetzlaff@thi.de
Technische Hochschule Ingolstadt,
Esplanade 10,
Ingolstadt 85049, Germany
e-mail: Ulrich.Tetzlaff@thi.de
1Present address: Application Technology, SABIC, Plasticslaan 1, Bergen Op Zoom 4612 PX, The Netherlands.
Contributed by the Electronic and Photonic Packaging Division of ASME for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received May 18, 2016; final manuscript received January 3, 2017; published online June 14, 2017. Assoc. Editor: Toru Ikeda.
J. Electron. Packag. Sep 2017, 139(3): 031002 (10 pages)
Published Online: June 14, 2017
Article history
Received:
May 18, 2016
Revised:
January 3, 2017
Citation
Thambi, J., Schiessl, A., Waltz, M., Lang, K., and Tetzlaff, U. (June 14, 2017). "Modified Constitutive Creep Laws With Micromechanical Modeling of Pb-Free Solder Alloys." ASME. J. Electron. Packag. September 2017; 139(3): 031002. https://doi.org/10.1115/1.4035850
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