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Issues
December 2010
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Determination of Spread Activation Energy and Assessment of Wetting Behavior of Solders on Metallic Substrates
J. Electron. Packag. December 2010, 132(4): 041001.
doi: https://doi.org/10.1115/1.4002899
Topics:
Solders
,
Surface roughness
,
Tin
,
Wetting
,
Relaxation (Physics)
On-Line Quality Detection of Ultrasonic Wire Bonding via Refining Analysis of Electrical Signal From Ultrasonic Generator
J. Electron. Packag. December 2010, 132(4): 041002.
doi: https://doi.org/10.1115/1.4002900
Topics:
Bonding
,
Feature extraction
,
Signals
,
Wire bonding
,
Generators
,
Principal component analysis
,
Wire
,
Damping
,
Artificial neural networks
,
Shear strength
Time-Independent and Time-Dependent Inelastic Strain Analysis of Lead-Free Solder by Cyclic Loading Test Using Stepped Ramp Waves
J. Electron. Packag. December 2010, 132(4): 041003.
doi: https://doi.org/10.1115/1.4002897
Topics:
Creep
,
Deformation
,
Lead-free solders
,
Stress
,
Waves
,
Solders
,
Alloys
Solid-State Refrigeration Based on the Electrocaloric Effect for Electronics Cooling
J. Electron. Packag. December 2010, 132(4): 041004.
doi: https://doi.org/10.1115/1.4002896
Topics:
Cooling
,
Electrodes
,
Temperature
,
Thermal conductivity
,
Manufacturing
Application of a Taguchi Method Technique in Determining the Laminating Process Parameters for a Bonding Sheet
J. Electron. Packag. December 2010, 132(4): 041005.
doi: https://doi.org/10.1115/1.4002723
Topics:
Bonding
,
Taguchi methods
,
Warping
,
Design
Multi-Objective Optimization of Thermo-Ultrasonic Flip-Chip Bonding Process for High-Brightness Light Emitting Diodes
J. Electron. Packag. December 2010, 132(4): 041006.
doi: https://doi.org/10.1115/1.4002727
Topics:
Bonding
,
Flip-chip
,
Light-emitting diodes
,
Leakage
,
Taguchi methods
The Effect of Thermal Contact Resistance at Porous-Solid Interfaces in Finned Metal Foam Heat Sinks
J. Electron. Packag. December 2010, 132(4): 041007.
doi: https://doi.org/10.1115/1.4002724
Topics:
Contact resistance
,
Heat sinks
,
Heat transfer
,
Metal foams
,
Fluids
,
Fins
,
Aluminum
,
Convection
,
Heat conduction
,
Epoxy adhesives
Fast Organic Conditioning of Patterned Surfaces for Capillary Part-to-Substrate Self-Assembly
J. Electron. Packag. December 2010, 132(4): 041008.
doi: https://doi.org/10.1115/1.4002725
Topics:
Coating processes
,
Coatings
,
Electronic packaging
,
Self-assembly
,
Fluids
,
Water
,
Hydrophobicity
An Investigation of Flat-Plate Oscillating Heat Pipes
J. Electron. Packag. December 2010, 132(4): 041009.
doi: https://doi.org/10.1115/1.4002726
Topics:
Diamonds
,
Flat plates
,
Fluids
,
Heat pipes
,
Heat transfer
,
Nanofluids
,
Temperature
,
Thermal resistance
,
Water
,
Operating temperature
Investigation of Effect of Creep Strain on Low-Cycle Fatigue of Lead-Free Solder by Cyclic Loading Using Stepped Ramp Waves
J. Electron. Packag. December 2010, 132(4): 041010.
doi: https://doi.org/10.1115/1.4002911
Topics:
Creep
,
Lead-free solders
,
Fatigue life
,
Compression
,
Fatigue testing
,
Waves
,
Stress
Successive Softening and Cyclic Damage in Viscoplastic Material
J. Electron. Packag. December 2010, 132(4): 041011.
doi: https://doi.org/10.1115/1.4002722
Topics:
Damage
,
Solders
,
Modeling
,
Finite element analysis
,
Cycles
Comparative Study of Phenolic-Based and Amine-Based Underfill Materials in Flip Chip Plastic Ball Grid Array Package
J. Electron. Packag. December 2010, 132(4): 041012.
doi: https://doi.org/10.1115/1.4002741
Topics:
Absorption
,
Adhesion
,
Flip-chip
,
Flip-chip devices
,
Fracture toughness
,
Packaging
,
Reliability
,
Shear (Mechanics)
,
Temperature
,
Young's modulus
Translation Solder Self-Alignment Mechanics Modeling for a Flip Chip in the Presence of a Viscous Fluid
J. Electron. Packag. December 2010, 132(4): 041013.
doi: https://doi.org/10.1115/1.4002825
Topics:
Flip-chip devices
,
Flow (Dynamics)
,
Solders
,
Modeling
,
Springs
,
Surface tension
,
Viscosity
,
Fluids
,
Dampers
Surface Topographical Characterization of Gold Aluminide Compound for Thermosonic Ball Bonding
J. Electron. Packag. December 2010, 132(4): 041014.
doi: https://doi.org/10.1115/1.4002728
Topics:
Bonding
,
Surface roughness
Thermal Conductivity of Diamond-Containing Grease
J. Electron. Packag. December 2010, 132(4): 041015.
doi: https://doi.org/10.1115/1.4003002
Technical Briefs
Effects of the Thermocompression Bonding on the Microstructure and Contact Resistance for the Ultrafine Pitch Chip-on-Glass Packaging With Nonconductive Film
J. Electron. Packag. December 2010, 132(4): 044501.
doi: https://doi.org/10.1115/1.4002898
Topics:
Bonding
,
Contact resistance
,
Packaging
,
Tin
,
Temperature
,
Pressure
,
Glass
,
High temperature
,
Melting point
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag