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Issues
September 2023
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Study on the Microstructure Evolution and Mechanical Properties of Cu/Cu41Sn11/Cu Solder Joint During High-Temperature Aging
J. Electron. Packag. September 2023, 145(3): 031001.
doi: https://doi.org/10.1115/1.4056329
Topics:
Mechanical properties
,
Solder joints
,
Tin
,
High temperature
,
Shear strength
Numerical Analysis of Flow and Heat Transfer Characteristics of Lattice-Based Compact Heat Sinks
J. Electron. Packag. September 2023, 145(3): 031002.
doi: https://doi.org/10.1115/1.4056305
Topics:
Flow (Dynamics)
,
Fluids
,
Heat transfer
,
Heat transfer coefficients
,
Topology
,
Temperature
Multi-Physics Models of a Low-Voltage Power Semiconductor System-in-Package for Automotive Applications
J. Electron. Packag. September 2023, 145(3): 031003.
doi: https://doi.org/10.1115/1.4056413
Topics:
Power semiconductor devices
,
Simulation
,
Design
,
Automotive industry
,
System-in-package
,
Thermomechanics
,
Cycles
Mandrel Bend Test of Screen-Printed Silver Conductors
J. Electron. Packag. September 2023, 145(3): 031004.
doi: https://doi.org/10.1115/1.4056530
Topics:
Cycles
,
Flexible electronics
,
Silver
,
Reliability
,
Inks
,
Damage
,
Imaging
Assessing the SAC305 Solder Joint Fatigue in Ball Grid Array Assembly Using Strain-Controlled and Stress-Controlled Approaches
J. Electron. Packag. September 2023, 145(3): 031005.
doi: https://doi.org/10.1115/1.4056559
Topics:
Ball-Grid-Array packaging
,
Cycles
,
Fatigue
,
Finishes
,
Solder joints
,
Stress
,
Fatigue life
,
Solders
,
Alloys
Investigation of Electromechanical Reliability and Radio Frequency Performance of a Highly Stretchable Liquid Metal Conductor for Wearable Electronics
Behnam Garakani, Udara S. Somarathna, Ashraf Umar, Gurvinder Singh Khinda, Mohamed Youssef M. Abdelatty, El Mehdi Abbara, Sari Al Zerey, Mike Hopkins, Sai Srinivas, Chuck Kinzel, Christopher Halseth, Mark Ronay, Mark D. Poliks
J. Electron. Packag. September 2023, 145(3): 031006.
doi: https://doi.org/10.1115/1.4056640
Topics:
Fatigue
,
Liquid metals
,
Tension
,
Transmission lines
,
Cycles
,
Fatigue testing
,
Reliability
,
Wearable devices
,
Metals
,
Simulation
A Time Frequency Domain Based Approach for Ball Grid Array Solder Joint Fatigue Analysis Using Global Local Modeling Technique
J. Electron. Packag. September 2023, 145(3): 031007.
doi: https://doi.org/10.1115/1.4056886
Topics:
Excitation
,
Fatigue life
,
Fatigue testing
,
Finite element analysis
,
Finite element model
,
Modeling
,
Resonance
,
Simulation
,
Solder joints
,
Stress
Process-Factor Optimization of Small-Area Sintered Interconnects for Power Electronics Applications
J. Electron. Packag. September 2023, 145(3): 031008.
doi: https://doi.org/10.1115/1.4056992
Topics:
Electronics
,
Experimental design
,
Intermetallic compounds
,
Optimization
,
Pressure
,
Shear strength
,
Silver
,
Sintering
,
Temperature
,
Failure
High Gain and Wideband Antenna-in-Package Solution Using Fan-Out Technology
J. Electron. Packag. September 2023, 145(3): 031009.
doi: https://doi.org/10.1115/1.4056991
Topics:
Design
,
Dipoles (Electromagnetism)
,
Manufacturing
,
Millimeter waves
,
Packaging
,
Radiation (Physics)
,
Signals
,
Simulation
,
Warping
,
Waveguides
Model Establishment of Chip Air Cooling Process and Its Proportional Integral Differential Tuning
J. Electron. Packag. September 2023, 145(3): 031010.
doi: https://doi.org/10.1115/1.4062530
Topics:
Convection
,
Cooling
,
Cycles
,
Heat
,
Temperature
,
Heat conduction
,
Optimization
,
Thermal resistance
,
Matlab
,
Energy dissipation
Numerical Study of Two-Stage Temperature Control Strategy for High-Temperature Stability of Satellite-Borne Fiber Optic Gyroscope
J. Electron. Packag. September 2023, 145(3): 031011.
doi: https://doi.org/10.1115/1.4062108
Topics:
Fibers
,
Heat
,
Satellites
,
Temperature
,
Temperature control
,
Thermoelectric coolers
,
Temperature controls
Technical Briefs
Artificial Intelligence for Power Electronics in Electric Vehicles: Challenges and Opportunities
J. Electron. Packag. September 2023, 145(3): 034501.
doi: https://doi.org/10.1115/1.4056306
A Comparison of Biaxial Bending Strength of Thin Silicon Dies in the Ball-on-Ring and PoEF Tests
J. Electron. Packag. September 2023, 145(3): 034502.
doi: https://doi.org/10.1115/1.4056717
Topics:
Bending strength
,
Silicon
,
Stress
,
Displacement
,
Failure mechanisms
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