One of the key limitations to long-term space missions is to avoid propellant boil-off in a microgravity space environment. Even with the use of active and passive controls of propellants, boil off is inevitable. Long-term CFD simulations on propellant behaviors depend on evaporation/condensation coefficients (known as accommodation coefficients) which are in turn dependent upon the wetting characteristics. Phase change experiments were conducted in the BT-2 neutron imaging facility at the National Institute of Standards and Technology (NIST) by introducing vapor H2 in 10 mm Al6061 and SS316L test cells placed inside the 70mm ‘orange’ cryostat. Condensation is achieved by lowering the cryostat temperature below the saturation point and vice versa for evaporation. The high neutron cross-section of liquid H2 in comparison to both the vapor and the test cell materials allows for visualization of a distinct liquid-vapor interface. Multiple images are stacked to increase the signal-to-noise ratio and the meniscus edge is obtained by detecting the pixels with largest gradients in intensities at the liquid meniscus. The contact angle is obtained by curve fitting of the Young-Laplace equation to the detected meniscus. The contact angle for Al6061 and SS316 is found to be between 0° and 4°. The uncertainty arises from edge detection, magnification, and resolution limits of the neutron imaging setup. The test was conducted at a saturation temperature of 21K (1.215 bar). The results from the neutron experiments will be then used in conjunction with FEA thermal models and kinetic phase change models to extract accommodation coefficients.
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Contact Angle Measurement of Liquid Hydrogen (LH2) in Stainless Steel and Aluminum Cells
Kishan Bellur,
Kishan Bellur
Michigan Technological University, Houghton, MI
ksbellur@mtu.edu
ksbellur@mtu.edu
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Vinaykumar Konduru,
Vinaykumar Konduru
Michigan Technological University, Houghton, MI
vkonduru@mtu.edu
vkonduru@mtu.edu
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Manan Kulshrestha,
Manan Kulshrestha
Michigan Technological University, Houghton, MI
mkulshre@mtu.edu
mkulshre@mtu.edu
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Daanish Tyrewala,
Daanish Tyrewala
Michigan Technological University, Houghton, MI
dstyrewa@mtu.edu
dstyrewa@mtu.edu
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Ezequiel Medici,
Ezequiel Medici
Michigan Technological University, Houghton, MI
efmedici@mtu.edu
efmedici@mtu.edu
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Jeffrey S. Allen,
Jeffrey S. Allen
Michigan Technological University, Houghton, MI
jstallen@mtu.edu
jstallen@mtu.edu
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Chang Kyoung Choi,
Chang Kyoung Choi
Michigan Technological University, Houghton, MI
cchoi@mtu.edu
cchoi@mtu.edu
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Daniel S. Hussey,
Daniel S. Hussey
National Institute of Standards and Technology, Gaithersburg, MD
daniel.hussey@nist.gov
daniel.hussey@nist.gov
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David C. Jacobson,
David C. Jacobson
National Institute of Standards and Technology, Gaithersburg, MD
david.jacobson@nist.gov
david.jacobson@nist.gov
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Juscelino B. Leão,
Juscelino B. Leão
National Institute of Standards and Technology, Gaithersburg, MD
juscelino.leao@nist.gov
juscelino.leao@nist.gov
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John McQuillen,
John McQuillen
NASA Glenn Research Center at Lewis Field, Cleveland, OH
john.b.mcquillen@nasa.gov
john.b.mcquillen@nasa.gov
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James Hermanson,
James Hermanson
University of Washington, Seattle, WA
jherm@aa.washington.edu
jherm@aa.washington.edu
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Arun Tamilarasan
Arun Tamilarasan
University of Washington, Seattle, WA
arunt@uw.edu
arunt@uw.edu
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Kishan Bellur
Michigan Technological University, Houghton, MI
ksbellur@mtu.edu
ksbellur@mtu.edu
Vinaykumar Konduru
Michigan Technological University, Houghton, MI
vkonduru@mtu.edu
vkonduru@mtu.edu
Manan Kulshrestha
Michigan Technological University, Houghton, MI
mkulshre@mtu.edu
mkulshre@mtu.edu
Daanish Tyrewala
Michigan Technological University, Houghton, MI
dstyrewa@mtu.edu
dstyrewa@mtu.edu
Ezequiel Medici
Michigan Technological University, Houghton, MI
efmedici@mtu.edu
efmedici@mtu.edu
Jeffrey S. Allen
Michigan Technological University, Houghton, MI
jstallen@mtu.edu
jstallen@mtu.edu
Chang Kyoung Choi
Michigan Technological University, Houghton, MI
cchoi@mtu.edu
cchoi@mtu.edu
Daniel S. Hussey
National Institute of Standards and Technology, Gaithersburg, MD
daniel.hussey@nist.gov
daniel.hussey@nist.gov
David C. Jacobson
National Institute of Standards and Technology, Gaithersburg, MD
david.jacobson@nist.gov
david.jacobson@nist.gov
Juscelino B. Leão
National Institute of Standards and Technology, Gaithersburg, MD
juscelino.leao@nist.gov
juscelino.leao@nist.gov
John McQuillen
NASA Glenn Research Center at Lewis Field, Cleveland, OH
john.b.mcquillen@nasa.gov
john.b.mcquillen@nasa.gov
James Hermanson
University of Washington, Seattle, WA
jherm@aa.washington.edu
jherm@aa.washington.edu
Arun Tamilarasan
University of Washington, Seattle, WA
arunt@uw.edu
arunt@uw.edu
1Corresponding author.
J. Heat Transfer. Feb 2016, 138(2): 020904
Published Online: January 18, 2016
Article history
Received:
November 5, 2015
Revised:
December 2, 2015
Citation
Bellur, K., Konduru, V., Kulshrestha, M., Tyrewala, D., Medici, E., Allen, J. S., Choi, C. K., Hussey, D. S., Jacobson, D. C., Leão, J. B., McQuillen, J., Hermanson, J., and Tamilarasan, A. (January 18, 2016). "Contact Angle Measurement of Liquid Hydrogen (LH2) in Stainless Steel and Aluminum Cells." ASME. J. Heat Transfer. February 2016; 138(2): 020904. https://doi.org/10.1115/1.4032232
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