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R. Ryan Vallance
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Proceedings Papers

Improving Robot System Performance Using Computer Vision

J. Barry Fallon, Charles F. Reinholtz, R. Ryan Vallance, Ravinder S. Voruganti, A. Lynn Abbott
Proc. ASME. DETC94, 23rd Biennial Mechanisms Conference: Robotics — Kinematics, Dynamics and Controls, 437-444, September 11–14, 1994
Publisher: American Society of Mechanical Engineers
Paper No: DETC1994-0353
https://doi.org/10.1115/DETC1994-0353
View Paper titled, Improving Robot System Performance Using Computer Vision
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Topics: Computers, Robots, Calibration, Feedback, Kinematics
Proceedings Papers

Near-Field Calibration of Isolated Carbon Nanotube Field Emitters for Nanomanufacturing Applications

King-Fu Hii, R. Ryan Vallance, Padmakar D. Kichambare, M. Pinar Mengu¨c¸
Proc. ASME. NANO2004, Design, Synthesis, and Applications, 121-123, September 22–24, 2004
Publisher: American Society of Mechanical Engineers
Paper No: NANO2004-46072
https://doi.org/10.1115/NANO2004-46072
View Paper titled, Near-Field Calibration of Isolated Carbon Nanotube Field Emitters for Nanomanufacturing Applications
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Topics: Calibration, Carbon nanotubes, Nanomanufacturing, Electrodes, Anodes, Current density, Electric fields, Electron field emission
Proceedings Papers

Mechanical Design of a Precision Instrument for Measuring the Roundness Profiles of Micro Shafts

Neil Loychik, Mathieu Barraja, Afzal Khan, R. Ryan Vallance, Eric R. Marsh, Dave A. Arneson
Proc. ASME. MSEC2006, Manufacturing Science and Engineering, Parts A and B, 859-865, October 8–11, 2006
Publisher: American Society of Mechanical Engineers
Paper No: MSEC2006-21101
https://doi.org/10.1115/MSEC2006-21101
View Paper titled, Mechanical Design of a Precision Instrument for Measuring the Roundness Profiles of Micro Shafts
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Topics: Design engineering, Instrumentation, Design, Metrology, Probes, Cutting tools, Electrons, Errors, Fluctuations (Physics), Micromachining
Proceedings Papers

Thermal Finite Difference Analysis of Threshold Heating for Nanoscale Machining

Chris A. Trinkle, Phil Smith, R. Ryan Vallance, Basil T. Wong, M. Pinar Mengu¨c¸
Proc. ASME. IMECE2002, Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology, 507-513, November 17–22, 2002
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2002-39377
https://doi.org/10.1115/IMECE2002-39377
View Paper titled, Thermal Finite Difference Analysis of Threshold Heating for Nanoscale Machining
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Topics: Heating, Machining, Nanoscale phenomena, Absorption, Atoms, Electron emission, Electrons, Heat, Heat conduction, Laser beams
Journal Articles

Effects of Spherical Targets on Capacitive Displacement Measurements

R. Ryan Vallance, Eric R. Marsh, Philip T. Smith
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. November 2004, 126(4): 822–829.
https://doi.org/10.1115/1.1813476
Published Online: February 4, 2005
View Article titled, Effects of Spherical Targets on Capacitive Displacement Measurements
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Topics: Capacitance, Electrodes, Finite element analysis, Sensors, Displacement measurement
Journal Articles

Nano-Scale Machining Via Electron Beam and Laser Processing

Basil T. Wong, M. Pinar Mengüç, R. Ryan Vallance
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. August 2004, 126(4): 566–576.
https://doi.org/10.1115/1.1777581
Published Online: May 12, 2004
View Article titled, Nano-Scale Machining Via Electron Beam and Laser Processing
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Topics: Cathode ray oscilloscopes, Electron beams, Electrons, Lasers, Machining, Temperature, Evaporation, Heating, Nanoscale phenomena
Journal Articles

A Predictive Model for Variation in the Pitch Between Stamped Pilot Holes

R. Ryan Vallance, Sepehr Kiani
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Technical Papers
J. Manuf. Sci. Eng. May 2003, 125(2): 384–393.
https://doi.org/10.1115/1.1559158
Published Online: April 15, 2003
View Article titled, A Predictive Model for Variation in the Pitch Between Stamped Pilot Holes
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Topics: Clearances (Engineering), Design, Errors, Pins (Engineering), Strips, Probability