Skip Nav Destination
Article navigation
April 1980
This article was originally published in
Journal of Lubrication Technology
Discussions
Discussion: “Development of a Laser Fluorescence Technique For Measuring Piston Ring Oil Film Thickness” (Ting, L. L., 1980, ASME J. Lubr. Technol., 102, pp. 165–170)
C. A. Foord
C. A. Foord
Rolls-Royce Ltd., Derby DE2-8BJ, England
Search for other works by this author on:
C. A. Foord
Rolls-Royce Ltd., Derby DE2-8BJ, England
J. of Lubrication Tech. Apr 1980, 102(2): 171 (1 pages)
Published Online: April 1, 1980
Article history
Online:
November 17, 2009
Connected Content
A commentary has been published:
Closure to “Discussions of ‘Vortex Shedding From Two Circular Cylinders in Staggered Arrangement’” (1980, ASME J. Fluids Eng., 102, pp. 171–173)
This is a commentary to:
Development of a Laser Fluorescence Technique For Measuring Piston Ring Oil Film Thickness
Citation
Foord, C. A. (April 1, 1980). "Discussion: “Development of a Laser Fluorescence Technique For Measuring Piston Ring Oil Film Thickness” (Ting, L. L., 1980, ASME J. Lubr. Technol., 102, pp. 165–170)." ASME. J. of Lubrication Tech. April 1980; 102(2): 171. https://doi.org/10.1115/1.3251460
Download citation file:
73
Views
Get Email Alerts
Cited By
Related Articles
Continuous Lubricant Film Thickness Measurement Between Piston Ring and Cylinder Bore
J. Eng. Gas Turbines Power (July,2018)
Development of a Laser Fluorescence Technique For Measuring Piston Ring Oil Film Thickness
J. of Lubrication Tech (April,1980)
Discussion: “Development of a Laser Fluorescence Technique For Measuring Piston Ring Oil Film Thickness” (Ting, L. L., 1980, ASME J. Lubr. Technol., 102, pp. 165–170)
J. of Lubrication Tech (April,1980)
Research on the Profile Design of Surface Texture in Piston Ring of Internal Combustion Engine
J. Tribol (November,2018)
Related Proceedings Papers
Related Chapters
A Remote Sensing Laser Fluorometer
Water Quality Parameters
Laser Techniques for Analysis of Ambient Air
Sampling and Analysis of Toxic Organics in the Atmosphere
Insulating Properties of W-Doped Ga2O3 Films Grown on Si Substrate for Low-K Applications
International Conference on Advanced Computer Theory and Engineering, 4th (ICACTE 2011)